Differential Interference Contrast
Differential interference contrast microscopy (DIC) ... is an optical microscopy illumination technique used to enhance the contrast in unstained samples. DIC works on the principle of interferometry to gain information about the optical density of the sample, to see otherwise invisible features. (Wikipedia).
Because DIC is a Non Linear imaging system, deconvolution can't be easily applied to it.
Still, Huygens users have reported that applying the deconvolution methods in the Huygens Software to DIC images seems to improve them. See Image Enhancement.
