Some basic concepts in microscopy
- Sampling Density vs. Sample Size
- UnderSampling
- Excitation Photons
- Medium Refractive Index
- Lens Refractive Index
- Excitation Wavelength
- Emission Wavelength
- Spherical Aberration
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- STED deconvolution now available in Huygens (Thu 23 of Feb., 2012)
- Migration of a Huygens license allowed every M&U year (Fri 06 of Jan., 2012)
- Huygens Image Contest 2011 (Wed 14 of Dec, 2011)
- Huygens Remote Manager 2.1 released (Tue 06 of Dec, 2011)
- Huygens Essential 4.1 version available! (Tue 15 of Nov., 2011)
- RBNCC for Colocalization Analyzer now available (Tue 11 of Oct., 2011)
- Huygens participates in Nanoscopy science project (Sun 29 of May, 2011)
Upcoming Events
| 1) |
Tue 05 of June, 2012
SVI Team present at ELMI conference in Leuven Belgium |
| 2) |
Thu 20 of Sep., 2012
Huygens Course September 20 until 22 of September 2012, Hilversum, NL |
Contact Information
Scientific Volume Imaging B.V.
Laapersveld 63
1213 VB Hilversum
The Netherlands
Phone: +31 (0)35 64216 26
E-mail: info at svi.nl
Laapersveld 63
1213 VB Hilversum
The Netherlands
Phone: +31 (0)35 64216 26
E-mail: info at svi.nl