-
- BackProjectedPinholeRadius BleedThrough BlurAndNoiseAffectColocalization CrossTalk DeconvolutionForNonOpticalImages DifficultiesReadingMetadata ExcitationWavelength FourPiPsf IdealSampling MicroscopicParameters MismatchDistortsPsf MismatchInRecordedBeads MultiChannel NyquistRate OtherOpticalConcepts PinholeRadius PointSpreadFunction SFP SimulatedFluorescenceProcess SingleChannel SpectralImageDeconvolution TheoVsExpPsf WaveLength
Page Title Search
Last Visits
Follow us
Headlines
- STED deconvolution now available in Huygens (Fri 06 of Jan., 2012)
- Migration of a Huygens license allowed every M&U year (Fri 06 of Jan., 2012)
- Huygens Image Contest 2011 (Wed 14 of Dec, 2011)
- Huygens Remote Manager 2.1 released (Tue 06 of Dec, 2011)
- Huygens Essential 4.1 version available! (Tue 15 of Nov., 2011)
Upcoming Events
| 1) |
Thu 09 of Feb., 2012 13:30 CET
Lecture on Deconvolution + Huygens Workshop at ALMF-EMBL Heidelberg |
| 2) |
Thu 08 of Mar., 2012 08:40 CET
Two-day Huygens imaging course March 8+9, 2012 |
| 3) |
Sun 15 of Apr., 2012 10:00 CEST
SVI at BSCB/BSDB Developmental Biology Conference, University of Warwick, UK |
| 4) |
Sat 09 of June, 2012 17:00 CEST
Seventeenth Annual INTERNATIONAL Course on 3D Microscopy of Living Cells with 3 days 3D Image Processing Course |
Contact Information
Scientific Volume Imaging B.V.
Laapersveld 63
1213 VB Hilversum
The Netherlands
Phone: +31 (0)35 64216 26
E-mail: info at svi.nl
Laapersveld 63
1213 VB Hilversum
The Netherlands
Phone: +31 (0)35 64216 26
E-mail: info at svi.nl
